JPH0212675U - - Google Patents

Info

Publication number
JPH0212675U
JPH0212675U JP9015488U JP9015488U JPH0212675U JP H0212675 U JPH0212675 U JP H0212675U JP 9015488 U JP9015488 U JP 9015488U JP 9015488 U JP9015488 U JP 9015488U JP H0212675 U JPH0212675 U JP H0212675U
Authority
JP
Japan
Prior art keywords
rotary table
printed circuit
inspection
probe
area
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9015488U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP9015488U priority Critical patent/JPH0212675U/ja
Publication of JPH0212675U publication Critical patent/JPH0212675U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
JP9015488U 1988-07-07 1988-07-07 Pending JPH0212675U (en])

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9015488U JPH0212675U (en]) 1988-07-07 1988-07-07

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9015488U JPH0212675U (en]) 1988-07-07 1988-07-07

Publications (1)

Publication Number Publication Date
JPH0212675U true JPH0212675U (en]) 1990-01-26

Family

ID=31314686

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9015488U Pending JPH0212675U (en]) 1988-07-07 1988-07-07

Country Status (1)

Country Link
JP (1) JPH0212675U (en])

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002277502A (ja) * 2001-01-12 2002-09-25 Nidec-Read Corp 基板検査装置及び基板検査方法
WO2010008030A1 (ja) * 2008-07-18 2010-01-21 日本電産リード株式会社 ピン先端部のクリーニング機構を有する基板検査装置

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002277502A (ja) * 2001-01-12 2002-09-25 Nidec-Read Corp 基板検査装置及び基板検査方法
WO2010008030A1 (ja) * 2008-07-18 2010-01-21 日本電産リード株式会社 ピン先端部のクリーニング機構を有する基板検査装置
CN102099699A (zh) * 2008-07-18 2011-06-15 日本电产丽德株式会社 具有销顶端部的清洁机构的基板检查装置
JP5594535B2 (ja) * 2008-07-18 2014-09-24 日本電産リード株式会社 ピン先端部のクリーニング機構を有する基板検査装置
TWI467182B (zh) * 2008-07-18 2015-01-01 Nidec Read Corp And a substrate inspection apparatus having a cleaning mechanism for the front end portion of the probe

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